Japan NISSHIN-NEM double-sided carbon conductive tape EDS\SEM scanning electron microscope inspection tape
Introducing NISSHIN-NEM Double-Sided Conductive Tape
Are you in need of a reliable and efficient adhesive tape for your SEM scanning electron microscope and EDS energy-dispersive X-ray spectrometer? Look no further than the NISSHIN-NEM Double-Sided Conductive Tape!
Features and Specifications
With a length of 2000mm and a width ranging from 5mm to 50mm, this tape is perfect for securely fixing observation samples. The tape is made from a non-woven fabric base material with an acrylic adhesive, providing stability and durability. The overall thickness is 0.16mm and the total thickness is 20000mm.
Conductive and Reliable
The NISSHIN-NEM Double-Sided Conductive Tape features a carbon powder conductive material, enabling excellent conductivity with a resistance rate of less than 5 OHMS/mm2. This ensures accurate and reliable results in your SEM and EDS experiments.
Easy to Use
This tape is designed with convenience in mind. Its double-sided adhesive nature allows for easy application and removal, while the presence of release paper ensures hassle-free handling.
Versatile and High-Quality
Whether you're conducting research in a laboratory or working in an industrial setting, this tape is a versatile option for various applications. Its temperature classification is at room temperature, and it is specifically designed for adhesive bonding in electron microscopy. The NISSHIN-NEM Double-Sided Conductive Tape is a reliable and high-quality choice.
Get Yours Today!
Don't miss out on this amazing product! Order your NISSHIN-NEM Double-Sided Conductive Tape now and experience the convenience and quality it offers. Click here to make your purchase.